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STM32L151V6T6DTR 查看數據表(PDF) - STMicroelectronics

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STM32L151V6T6DTR Datasheet PDF : 133 Pages
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STM32L151x6/8/B STM32L152x6/8/B
Electrical characteristics
6.3.12
Static latch-up
Two complementary static tests are required on six parts to assess the latch-up
performance:
A supply overvoltage is applied to each power supply pin
A current injection is applied to each input, output and configurable I/O pin
These tests are compliant with EIA/JESD 78A IC latch-up standard.
Table 40. Electrical sensitivities
Symbol
Parameter
Conditions
LU
Static latch-up class TA = +105 °C conforming to JESD78A
Class
II level A
I/O current injection characteristics
As a general rule, current injection to the I/O pins, due to external voltage below VSS or
above VDD (for standard pins) should be avoided during normal product operation.
However, in order to give an indication of the robustness of the microcontroller in cases
when abnormal injection accidentally happens, susceptibility tests are performed on a
sample basis during device characterization.
Functional susceptibility to I/O current injection
While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into
the I/O pin, one at a time, the device is checked for functional failures.
The failure is indicated by an out of range parameter: ADC error, out of spec current
injection on adjacent pins or other functional failure (for example reset, oscillator frequency
deviation, LCD levels, etc.).
The test results are given in Table 41.
Table 41. I/O current injection susceptibility
Symbol
Description
Functional susceptibility
Negative
Positive
Unit
injection
injection
Injected current on all 5 V tolerant (FT) pins
-5
IINJ
Injected current on any other pin
-5
+0
mA
+5
Note:
It is recommended to add a Schottky diode (pin to ground) to analog pins which may
potentially inject negative currents.
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