STM32F302CCT6TR 查看數據表（PDF） - STMicroelectronics

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STM32F302CCT6TR

ARM Cortex-M4F 32b MCU+FPU, up to 256KB Flash+48KB SRAM 4 ADCs, 2 DAC ch., 7 comp, 4 PGA, timers, 2.0-3.6 V operation

STMicroelectronics 

STM32F302xx/STM32F303xx

Electrical characteristics

Static latch-up

Two complementary static tests are required on six parts to assess the latch-up

performance:

● A supply overvoltage is applied to each power supply pin

● A current injection is applied to each input, output and configurable I/O pin

These tests are compliant with EIA/JESD 78A IC latch-up standard.

Table 50. Electrical sensitivities

Symbol

Parameter

Conditions

LU

Static latch-up class TA = +105 °C conforming to JESD78A

Class

II level A

6.3.13

I/O current injection characteristics

As a general rule, current injection to the I/O pins, due to external voltage below VSS or

above VDD (for standard, 3 V-capable I/O pins) should be avoided during normal product

operation. However, in order to give an indication of the robustness of the microcontroller in

cases when abnormal injection accidentally happens, susceptibility tests are performed on a

sample basis during device characterization.

Functional susceptibility to I/O current injection

While a simple application is executed on the device, the device is stressed by injecting

current into the I/O pins programmed in floating input mode. While current is injected into the

I/O pin, one at a time, the device is checked for functional failures.

The failure is indicated by an out of range parameter: ADC error above a certain limit (higher

than 5 LSB TUE), out of conventional limits of induced leakage current on adjacent pins (out

of –5 µA/+0 µA range), or other functional failure (for example reset occurrence or oscillator

frequency deviation).

The test results are given in Table 51

Doc ID 023353 Rev 5

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