ST72F324K2TCR 查看數據表（PDF） - STMicroelectronics

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ST72F324K2TCR

8-bit MCU for automotive, 3.8 to 5.5V operating range with 8 to 32 Kbyte Flash, 10-bit ADC, 4 timers, SPI, SCI

STMicroelectronics 

ST72324xx-Auto

Electrical characteristics

12.5.2

Supply and clock managers

The previous current consumption specified for the ST7 functional operating modes over

temperature range does not take into account the clock source current consumption. To

obtain the total device consumption, the two current values must be added (except for Halt

mode).

Table 90. Oscillators, PLL and LVD current consumption

Symbol

Parameter

Conditions

Typ

Max Unit

IDD(RCINT) Supply current of internal RC oscillator

625

Obsolete Product(s) - Obsolete Product(s) 12.5.3

IDD(RES) Supply current of resonator oscillator(1)(2)

see Section 12.6.3

on page 155

µA

IDD(PLL) PLL supply current

IDD(LVD) LVD supply current

VDD = 5V

360

150

300

1. Data based on characterization results done with the external components specified in Section 12.6.3, not

tested in production.

2. As the oscillator is based on a current source, the consumption does not depend on the voltage.

On-chip peripherals

.

Table 91. On-chip peripherals current consumption

Symbol

Parameter

Conditions

Typ Unit

IDD(TIM) 16-bit timer supply current(1)

50

IDD(SPI) SPI supply current(2)

IDD(SCI) SCI supply current(3)

TA = 25°C, fCPU = 4 MHz, VDD = 5.0V

µA

400

IDD(ADC) ADC supply current when converting(4)

1. Data based on a differential IDD measurement between reset configuration (timer counter running at

fCPU/4) and timer counter stopped (only TIMD bit set). Data valid for one timer.

2. Data based on a differential IDD measurement between reset configuration (SPI disabled) and a permanent

SPI master communication at maximum speed (data sent equal to 55h). This measurement includes the

pad toggling consumption.

3. Data based on a differential IDD measurement between SCI low power state (SCID = 1) and a permanent

SCI data transmit sequence.

4. Data based on a differential IDD measurement between reset configuration and continuous A/D

conversions.

Doc ID 13841 Rev 1

153/193

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