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ST72F324J6TATX 查看數據表(PDF) - STMicroelectronics

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ST72F324J6TATX Datasheet PDF : 194 Pages
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ST72324xx-Auto
Electrical characteristics
can be simulated: Human Body Model and Machine Model. This test conforms to the
JESD22-A114A/A115A standard.
Table 102. Absolute maximum ratings
Symbol
Ratings
Conditions
Maximum value(1) Unit
VESD(HBM)
Electrostatic discharge voltage
(human body model)
2000
VESD(MM)
Electrostatic discharge voltage
(machine model)
TA = +25°C
200
V
VESD(CDM)
Electrostatic discharge voltage
(charged device model)
250
1. Data based on characterization results, not tested in production.
t(s) Static and dynamic Latch-Up
uc LU: 3 complementary static tests are required on 10 parts to assess the latch-up
rod performance. A supply overvoltage (applied to each power supply pin) and a current
injection (applied to each input, output and configurable I/O pin) are performed on each
P sample. This test conforms to the EIA/JESD 78 IC latch-up standard. For more details,
te refer to the application note AN1181.
le DLU: Electrostatic discharges (one positive then one negative test) are applied to each
o pin of three samples when the micro is running to assess the latch-up performance in
s dynamic mode. Power supplies are set to the typical values, the oscillator is connected
b as near as possible to the pins of the micro and the component is put in reset mode.
O This test conforms to the IEC1000-4-2 and SAEJ1752/3 standards. For more details,
- refer to the application note AN1181.
t(s) Table 103. Electrical sensitivities
uc Symbol
Parameter
Conditions
Class(1)
rod TA = +25°C
A
LU Static latch-up class
TA = +85°C
A
P TA = +125°C
A
teDLU Dynamic latch-up class
VDD = 5.5V, fOSC = 4 MHz, TA = +25°C
A
le1. Class description: A Class is an STMicroelectronics internal specification. All its limits are higher than the
o JEDEC specifications, meaning that when a device belongs to Class A, it exceeds the JEDEC standard. B
Obs Class strictly covers all the JEDEC criteria (international standard).
Doc ID 13841 Rev 1
161/193

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