SST29LE010-120-4C-PH 查看數據表（PDF） - Silicon Storage Technology

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SST29LE010-120-4C-PH

1 Megabit (128K x 8) Page Mode EEPROM

Silicon Storage Technology 

1 Megabit Page Mode EEPROM

SST29EE010, SST29LE010, SST29VE010

2.4

2.0

2.0

1

INPUT

REFERENCE POINTS

OUTPUT

0.8

0.8

0.4

2

304 MSW F12.0

3

AC test inputs are driven at VOH (2.4 VTTL) for a logic “1” and VOL (0.4 VTTL) for a logic “0”. Measurement reference

points for inputs and outputs are VIH (2.0 VTTL) and VIL (0.8 VTTL). Inputs rise and fall times (10% ↔ 90%) are <10

ns.

4

FIGURE 12: AC INPUT/OUTPUT REFERENCE WAVEFORMS

5

6

TO DUT

TEST LOAD EXAMPLE

TO TESTER

CL

RL LOW

7

VCC

8

9

RL HIGH

10

11

12

FIGURE 13: TEST LOAD EXAMPLE

13

304 MSW F13.0

14

15

16

© 1998 Silicon Storage Technology, Inc.

17

304-04 12/97

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