STM32WB35CGV7 查看數據表（PDF） - STMicroelectronics

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STM32WB35CGV7

Multiprotocol wireless 32-bit MCU Arm®-based Cortex®-M4 with FPU, Bluetooth® 5 and 802.15.4 radio solution

STMicroelectronics 

STM32WB55xx STM32WB35xx

Electrical characteristics

Static latch-up

Two complementary static tests are required on six parts to assess the latch-up

performance:

 a supply overvoltage is applied to each power supply pin

 a current injection is applied to each input, output and configurable I/O pin.

These tests are compliant with EIA/JESD 78A IC latch-up standard.

Table 70. Electrical sensitivity

Symbol

Parameter

Conditions

LU

Static latch-up class TA = +105 °C conforming to JESD78A

Class

II

6.3.16

I/O current injection characteristics

As a general rule, current injection to the I/O pins, due to external voltage below VSS or

above VDD (for standard, 3.3 V-capable I/O pins) should be avoided during normal product

operation. However, in order to give an indication of the robustness of the microcontroller in

cases when abnormal injection accidentally happens, susceptibility tests are performed on a

sample basis during device characterization.

Functional susceptibility to I/O current injection

While a simple application is executed on the device, the device is stressed by injecting

current into the I/O pins programmed in floating input mode. While current is injected into

the I/O pin, one at a time, the device is checked for functional failures.

The failure is indicated by an out of range parameter: ADC error above a certain limit (higher

than 5 LSB TUE), out of conventional limits of induced leakage current on adjacent pins (out

of the -5 µA / 0 µA range) or other functional failure (for example reset occurrence or

oscillator frequency deviation).

The characterization results are given in Table 71.

Negative induced leakage current is caused by negative injection and positive induced

leakage current is caused by positive injection.

Table 71. I/O current injection susceptibility(1)

Symbol

Description

Functional susceptibility

Negative

injection

Positive

injection

Injected current on all pins except PB0, PB1

-5

IINJ

Injected current on PB0, PB1 pins

-5

N/A(2)

0

1. Guaranteed by characterization results.

2. Injection not possible.

Unit

mA

DS11929 Rev 10

133/193

169

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