CLP270M-TR View Datasheet(PDF) - STMicroelectronics
Part Name
Description
Manufacturer
CLP270M-TR Datasheet PDF : 24 Pages
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CLP270M
ABSOLUTE MAXIMUM RATINGS (RSENSE = 4 Ω, and Tamb = 25 °C)
Symbol
Parameter
Test Conditions
IPP
Line to GND peak surge
current
10/1000µs (open circuit voltage
wave shape 10/1000µs)
5/310µs (open circuit voltage
wave shape 10/700µs)
2/10µs (open circuit voltage
wave shape)
ITSM
Non repetitive surge peak
tp = 20 ms
on-state current (TIP or
RING versus Ground)
tp = 200 ms
F = 50 Hz
tp = 2 s
Tstg
Storage temperature range
Tj
Maximum junction temperature
TL
Maximum lead temperature for soldering during 10 s
Value
Unit
100
A
150
500
60
A
30
A
15
A
- 40 to + 150 °C
150
260
°C
ELECTRICAL CHARACTERISTICS (RSENSE = 4 Ω, and Tamb = 25°C)
Symbol
ILGL
Vref
VSWON
ISWOFF
ISWON
C
Parameter
Line to GND leakage
current
Overvoltage internal
reference
Line to GND voltage at
SW1 or SW2 switching-on
Line to GND current at
SW1 or SW2 switching-off
(negative current)
Line current at SW1 or
SW2 switching-on
RING to GND capacitance
TIP to GND capacitance
TIP to RING capacitance
Test Conditions
. VLG = 240 V
. Measured between TIP
(or RING) and GND
. ILG = 1 mA
. Measured between TIP
(or RING) and GND
. Measured at 50 Hz between
TIPL (or RINGL) and GND
. Refer to test circuit page 17
. Positive pulse
. Negative pulse
. VRINGL = -1 V
. VTIPL = -48 V
. VGND = 0 V
. F = 1 MHz VRMS = 1V
Value
Unit
Min. Typ. Max.
10 µA
265
V
400 V
150
mA
150
280 mA
190
320
180
pF
62
57
16/24
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