M58BW016BT, M58BW016BB, M58BW016DT, M58BW016DB
Table 15. DC Characteristics
Symbol
Parameter
ILI Input Leakage Current
ILO Output Leakage Current
IDD Supply Current (Random Read)
IDDB Supply Current (Burst Read)
Supply Current (Standby)
IDD1
Supply Current (Auto Low-Power)
IDD2 Supply Current (Reset/Power-down)
IDD3
Supply Current (Program or Erase,
Set Lock Bit, Erase Lock Bit)
IDD4
Supply Current
(Erase/Program Suspend)
IPP Program Current (Read or Standby)
IPP1 Program Current (Read or Standby)
IPP2 Program Current (Power-down)
Program Current (Program)
IPP3 Program in Progress
IPP4
Program Current (Erase)
Erase in Progress
VIL
VIH
VIH
VOL
VOH
VPP1
VPPH
VLKO
VPPLK
Input Low Voltage
Input High Voltage (for DQ lines)
Input High Voltage (for Input only
lines)
Output Low Voltage
Output High Voltage CMOS
Program Voltage
(Program or Erase operations)
Program Voltage
(Program or Erase operations)
VDD Supply Voltage (Erase and
Program lockout)
VPP Supply Voltage (Erase and
Program lockout)
Test Condition
0V≤VIN ≤VDDQ
0V≤VOUT ≤VDDQ
E = VIL, G = VIH, fadd = 6MHz
E = VIL, G = VIH, fclock =
56MHz
E = RP = VDD ± 0.2V
E = VSS ± 0.2V,
RP = VDD ± 0.2V
RP = VSS ± 0.2V
Program, Block Erase in
progress
E = VIH
VPP ≥ VPP1
VPP ≤VPP1
RP = VIL
VPP = VPP1
VPP = VPPH
VPP = VPP1
VPP = VPPH
IOL = 100µA
IOH = –100µA
Min
Max
±1
±5
20
30
60
60
60
30
40
± 30
± 30
±5
200
20
200
20
–0.5
0.8VDDQIN
0.2VDDQIN
VDDQ +0.3
0.8VDDQIN
3.6
0.1
VDDQ –0.1
2.7
3.6
11.4
12.6
2.2
11.4
Unit
µA
µA
mA
mA
µA
µA
µA
mA
µA
µA
µA
µA
µA
mA
µA
mA
V
V
V
V
V
V
V
V
V
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