M68AW512D
Figure 13. E1 Controlled, Low VCC Data Retention AC Waveforms
3.6V
VCC
2.7V
VDR > 1.5V
E1 or UB/LB
DATA RETENTION MODE
tCDR
E1 ≥ VDR – 0.2V or UB = LB ≥ VDR – 0.2V
tR
AI05985
Figure 14. E2 Controlled, Low VCC Data Retention AC Waveforms
3.6V
VCC
2.7V
VDR > 1.5V
E2
DATA RETENTION MODE
tCDR
E2 < 0.2V
tR
AI05986c
Table 9. Low VCC Data Retention Characteristics
Symbol
Parameter
Test Condition
Min
ICCDR (1) Supply Current (Data Retention)
VCC = 1.5V, E1 ≥ VCC –0.2V or
E2 ≤0.2V or UB = LB ≥ VCC –0.2V, f = 0
tCDR (1,2)
Chip Deselected to Data
Retention Time
0
tR (2) Operation Recovery Time
tAVAV
VDR (1) Supply Voltage (Data Retention)
E1 ≥ VCC –0.2V or E2 ≤0.2V or
UB = LB ≥ VCC –0.2V, f = 0
1.5
Note: 1. All other Inputs at VIH ≥ VCC –0.2V or VIL ≤0.2V.
2. Tested initially and after any design or process that may affect these parameters. tAVAV is Read cycle time.
3. No input may exceed VCC +0.2V.
Max
30
Unit
µA
ns
ns
V
18/22