ATSAM4LS4BA-AU View Datasheet(PDF) - Atmel Corporation

Part Name

Description

Manufacturer

ATSAM4LS4BA-AU

ATSAM ARM-based Flash MCU

Atmel Corporation 

ATSAM4L8/L4/L2

8.7.14.4

CLAMP

This instruction selects the Bypass register as Data Register. The device output pins are driven

from the boundary-scan chain.

Starting in Run-Test/Idle, the CLAMP instruction is accessed the following way:

1. Select the IR Scan path.

2. In Capture-IR: The IR output value is latched into the shift register.

3. In Shift-IR: The instruction register is shifted by the TCK input.

4. In Update-IR: The data from the boundary-scan chain is applied to the output pins.

5. Return to Run-Test/Idle.

6. Select the DR Scan path.

7. In Capture-DR: A logic ‘0’ is loaded into the Bypass Register.

8. In Shift-DR: Data is scanned from TDI to TDO through the Bypass register.

9. Return to Run-Test/Idle.

Table 8-8. CLAMP Details

Instructions

IR input value

IR output value

DR Size

DR input value

DR output value

Details

0101 (0x5)

p00s

1

x

x

76

42023GS–SAM–03/2014

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