MX29F040QC-12 View Datasheet(PDF) - Macronix International

Part Name

Description

Manufacturer

MX29F040QC-12

4M-BIT [512KX8] CMOS EQUAL SECTOR FLASH MEMORY

Macronix International 

SWITCHING TEST CIRCUITS

DEVICE UNDER

TEST

MX29F040

CL

1.2K ohm

1.6K ohm

+5V

DIODES=IN3064

OR EQUIVALENT

CL=100pF Including jig capacitance

CL= 50pF for 29F040-55

SWITCHING TEST WAVEFORMS

2.4V

0.45V

INPUT

2.0V

0.8V

TEST POINTS

2.0V

0.8V

OUTPUT

AC TESTING: Inputs are driven at 2.4V for a logic "1" and 0.45V for a logic "0".

Input pulse rise and fall times are < 20ns.(5ns for 29F040-55)

Note:VIH/VIL=3.0/0V,VOH/VOL=1.5/1.5V for 29F040-55

COMMAND WRITE TIMING WAVEFORM

VCC

5V

Addresses VIH

VIL

WE VIH

VIL

CE VIH

VIL

OE VIH

VIL

VIH

Data

VIL

tAS

tOES

ADD Valid

tAH

tCEP

tCWC

tCS

tCH

tDS

tDH

DIN

tCEPH1

P/N:PM0538

REV. 2.3, DEC. 10, 2004

16

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