Diagnostics functional description
TDA7563PD
Figure 19. SVR and output behavior (case 1: without turn-on diagnostic)
Vsvr
Out
Permanent diagnostic
acquisition time (100mS Typ)
) Bias (power amp turn-on)
Diagnostic Enable
(Permanent)
FAULT
event
t
Read Data
ct(s I2CB DATA
Permanent Diagnostics data (output)
permitted time
Produ t(s) Figure 20. SVR and output pin behavior (case 2: with turn-on diagnostic)
lete uc Vsvr
so rod Out
Turn-on diagnostic
acquisition time (100mS Typ)
Permanent diagnostic
acquisition time (100mS Typ)
uct(s) - OObbsolete P t
d Diagnostic Enable
ro - (Turn-on)
Turn-on Diagnostics data (output)
permitted time
Diagnostic Enable
(Permanent)
FAULT
event
P t(s) Bias (power amp turn-on)
te cpermitted time
Read Data
Permanent Diagnostics data (output)
permitted time
le du I2CB DATA
bso Pro The information related to the outputs status is read and memorized at the end of the
O tecurrent pulse top. The acquisition time is 100 ms (typ.). No audible noise is generated in the
leprocess. As for SHORT TO GND / VS the fault-detection thresholds remain unchanged from
o 30 dB to 16 dB gain setting. They are as follows:TDA7563PD
Obs Figure 21. Thresholds for short to GND/VS
S.C. to GND x Normal Operation x
S.C. to Vs
0V
1.2V 1.8V
VS-1.8V VS-1.2V
VS
D01AU1253
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