JS28F128P30BF65 View Datasheet(PDF) - Numonyx -> Micron

Part Name

Description

Manufacturer

JS28F128P30BF65

Axcell™ P30-65nm Flash Memory 128-Mbit, 64-Mbit Single Bit per Cell (SBC)

Numonyx -> Micron 

P30-65nm SBC

15.0 AC Characteristics

15.1

AC Test Conditions

Figure 16: AC Input/Output Reference Waveform

VCCQ

0V

Input VCCQ/2

Test Points

VCCQ/2 Output

IO_REF.WMF

Note: AC test inputs are driven at VCCQ for Logic "1" and 0 V for Logic "0." Input/output timing begins/ends at VCCQ/2. Input

rise and fall times (10% to 90%) < 5ns. Worst case speed occurs at VCC = VCCMin.

Figure 17: Transient Equivalent Testing Load Circuit

Device

Under Test

Out

CL

Notes:

1.

See the following table for component values.

2.

Test configuration component value for worst case speed conditions.

3.

CL includes jig capacitance

.

Table 23: Test Configuration Component Value for Worst Case Speed Conditions

Test Configuration

VCCQ Min Standard Test

CL (pF)

30

Datasheet

48

Apr 2010

Order Number: 208033-02

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