DSPIC33FJ32MC304-I/SP View Datasheet(PDF) - Microchip Technology

Part Name

Description

Manufacturer

DSPIC33FJ32MC304-I/SP

16-bit Digital Signal Controllers (up to 128 KB Flash and 16K SRAM) with Motor Control PWM and Advanced Analog

Microchip Technology 

dsPIC33FJ32MC302/304, dsPIC33FJ64MCX02/X04 AND dsPIC33FJ128MCX02/X04

32.0 HIGH TEMPERATURE ELECTRICAL CHARACTERISTICS

This section provides an overview of dsPIC33FJ32MC302/304, dsPIC33FJ64MCX02/X04 and dsPIC33FJ128MCX02/

X04 electrical characteristics for devices operating in an ambient temperature range of -40°C to +150°C.

The specifications between -40°C to +150°C are identical to those shown in Section 31.0 “Electrical Characteristics”

for operation between -40°C to +125°C, with the exception of the parameters listed in this section.

Parameters in this section begin with an H, which denotes High temperature. For example, parameter DC10 in

Section 31.0 “Electrical Characteristics” is the Industrial and Extended temperature equivalent of HDC10.

Absolute maximum ratings for the dsPIC33FJ32MC302/304, dsPIC33FJ64MCX02/X04 and dsPIC33FJ128MCX02/

X04 high temperature devices are listed below. Exposure to these maximum rating conditions for extended periods can

affect device reliability. Functional operation of the device at these or any other conditions above the parameters

indicated in the operation listings of this specification is not implied.

Absolute Maximum Ratings(1)

Ambient temperature under bias(4) .........................................................................................................-40°C to +150°C

Storage temperature .............................................................................................................................. -65°C to +160°C

Voltage on VDD with respect to VSS ......................................................................................................... -0.3V to +4.0V

Voltage on any pin that is not 5V tolerant with respect to VSS(5) .................................................... -0.3V to (VDD + 0.3V)

Voltage on any 5V tolerant pin with respect to VSS when VDD < 3.0V(5) ....................................... -0.3V to (VDD + 0.3V)

Voltage on any 5V tolerant pin with respect to VSS when VDD ≥ 3.0V(5) .................................................... -0.3V to 5.6V

Maximum current out of VSS pin .............................................................................................................................60 mA

Maximum current into VDD pin(2).............................................................................................................................60 mA

Maximum junction temperature............................................................................................................................. +155°C

Maximum current sourced/sunk by any 2x I/O pin(3) ................................................................................................2 mA

Maximum current sourced/sunk by any 4x I/O pin(3) ................................................................................................4 mA

Maximum current sourced/sunk by any 8x I/O pin(3) ................................................................................................8 mA

Maximum current sunk by all ports combined ........................................................................................................70 mA

Maximum current sourced by all ports combined(2) ................................................................................................70 mA

Note 1: Stresses above those listed under “Absolute Maximum Ratings” can cause permanent damage to the

device. This is a stress rating only, and functional operation of the device at those or any other conditions

above those indicated in the operation listings of this specification is not implied. Exposure to maximum

rating conditions for extended periods can affect device reliability.

2: Maximum allowable current is a function of device maximum power dissipation (see Table 32-2).

3: Unlike devices at 125°C and below, the specifications in this section also apply to the CLKOUT, VREF+,

VREF-, SCLx, SDAx, PGCx and PGDx pins.

4: AEC-Q100 reliability testing for devices intended to operate at 150°C is 1,000 hours. Any design in which

the total operating time from 125°C to 150°C will be greater than 1,000 hours is not warranted without prior

written approval from Microchip Technology Inc.

5: Refer to the “Pin Diagrams” section for 5V tolerant pins.

© 2007-2012 Microchip Technology Inc.

DS70291G-page 413

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