STM32F091VB View Datasheet(PDF) - STMicroelectronics

Part Name

Description

Manufacturer

STM32F091VB

ARM®-based 32-bit MCU, up to 256 KB Flash, CAN, 12 timers, ADC, DAC, and comm. interfaces, 2.0 - 3.6V

STMicroelectronics 

Electrical characteristics

STM32F091xB STM32F091xC

Symbol

Table 47. Flash memory endurance and data retention

Parameter

Conditions

Min(1)

NEND Endurance

TA = –40 to +105 °C

10

1 kcycle(2) at TA = 85 °C

30

tRET Data retention

1 kcycle(2) at TA = 105 °C

10

10 kcycle(2) at TA = 55 °C

20

1. Data based on characterization results, not tested in production.

2. Cycling performed over the whole temperature range.

Unit

kcycle

Year

6.3.11

EMC characteristics

Susceptibility tests are performed on a sample basis during device characterization.

Functional EMS (electromagnetic susceptibility)

While a simple application is executed on the device (toggling 2 LEDs through I/O ports).

the device is stressed by two electromagnetic events until a failure occurs. The failure is

indicated by the LEDs:

• Electrostatic discharge (ESD) (positive and negative) is applied to all device pins until

a functional disturbance occurs. This test is compliant with the IEC 61000-4-2 standard.

• FTB: A Burst of Fast Transient voltage (positive and negative) is applied to VDD and

VSS through a 100 pF capacitor, until a functional disturbance occurs. This test is

compliant with the IEC 61000-4-4 standard.

A device reset allows normal operations to be resumed.

The test results are given in Table 48. They are based on the EMS levels and classes

defined in application note AN1709.

Table 48. EMS characteristics

Symbol

Parameter

Conditions

VFESD

VEFTB

Voltage limits to be applied on any I/O pin

to induce a functional disturbance

VDD = 3.3 V, LQFP100, TA = +25 °C,

fHCLK = 48 MHz,

conforming to IEC 61000-4-2

Fast transient voltage burst limits to be VDD = 3.3 V, LQFP100, TA = +25°C,

applied through 100 pF on VDD and VSS fHCLK = 48 MHz,

pins to induce a functional disturbance conforming to IEC 61000-4-4

Level/

Class

2B

4B

Designing hardened software to avoid noise problems

EMC characterization and optimization are performed at component level with a typical

application environment and simplified MCU software. It should be noted that good EMC

performance is highly dependent on the user application and the software in particular.

Therefore it is recommended that the user applies EMC software optimization and

prequalification tests in relation with the EMC level requested for his application.

76/128

DocID026284 Rev 4

Share Link: