STM32L152RCY7 View Datasheet(PDF) - STMicroelectronics

Part Name

Description

Manufacturer

STM32L152RCY7

Ultra-low-power 32-bit MCU ARM®-based Cortex®-M3, 256KB Flash, 32KB SRAM, 8KB EEPROM, LCD, USB, ADC, DAC

STMicroelectronics 

Electrical characteristics

STM32L151xC STM32L152xC

Table 59. DAC characteristics (continued)

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

dOffset/dT(1)

Offset error temperature

coefficient (code 0x800)

VDDA = 3.3V

VREF+ = 3.0V

TA = 0 to 50 ° C

DAC output buffer OFF

VDDA = 3.3V

VREF+ = 3.0V

TA = 0 to 50 ° C

DAC output buffer ON

Gain(1)

Gain error(7)

CL ≤ 50 pF, RL ≥ 5 kΩ

DAC output buffer ON

No RL, CL ≤ 50 pF

DAC output buffer OFF

dGain/dT(1)

Gain error temperature

coefficient

VDDA = 3.3V

VREF+ = 3.0V

TA = 0 to 50 ° C

DAC output buffer OFF

VDDA = 3.3V

VREF+ = 3.0V

TA = 0 to 50 ° C

DAC output buffer ON

TUE(1)

Total unadjusted error

CL ≤ 50 pF, RL ≥ 5 kΩ

DAC output buffer ON

No RL, CL ≤ 50 pF

DAC output buffer OFF

tSETTLING

Settling time (full scale:

for a 12-bit code

transition between the

lowest and the highest

input codes till

DAC_OUT reaches final

value ±1LSB

CL ≤ 50 pF, RL ≥ 5 kΩ

Update rate

Max frequency for a

correct DAC_OUT

change (95% of final

value) with 1 LSB

variation in the input

code

CL ≤ 50 pF, RL ≥ 5 kΩ

tWAKEUP

Wakeup time from off

state (setting the ENx bit

in the DAC Control

register)(8)

CL ≤ 50 pF, RL ≥ 5 kΩ

PSRR+

VDDA supply rejection

ratio (static DC

measurement)

CL ≤ 50 pF, RL ≥ 5 kΩ

-20

-10

0

20

0

µV/°C

50

- +0.1 / -0.2% +0.2 / -0.5%

%

- +0 / -0.2% +0 / -0.4%

-10

-2

-40

-8

0

µV/°C

0

-

12

-

8

30

LSB

12

-

7

12

µs

-

-

1

Msps

-

9

-

-60

15

µs

-35

dB

1. Data based on characterization results.

2. Connected between DAC_OUT and VSSA.

3. Difference between two consecutive codes - 1 LSB.

104/136

DocID022799 Rev 13

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