STM32F302VC View Datasheet(PDF) - STMicroelectronics

Part Name

Description

Manufacturer

STM32F302VC

ARM Cortex-M4F 32b MCU+FPU, up to 256KB Flash+48KB SRAM 4 ADCs, 2 DAC ch., 7 comp, 4 PGA, timers, 2.0-3.6 V operation

STMicroelectronics 

Electrical characteristics

STM32F302xx/STM32F303xx

6.3.4

Table 25. Programmable voltage detector characteristics

Symbol

Parameter

Conditions

Min(1) Typ Max(1) Unit

VPVD0

PVD threshold 0

VPVD1

PVD threshold 1

VPVD2

PVD threshold 2

Rising edge

Falling edge

Rising edge

Falling edge

Rising edge

Falling edge

2.1 2.18 2.26

2 2.08 2.16

2.19 2.28 2.37

2.09 2.18 2.27

2.28 2.38 2.48

2.18 2.28 2.38

VPVD3

PVD threshold 3

VPVD4

PVD threshold 4

Rising edge

Falling edge

Rising edge

Falling edge

2.38 2.48 2.58

2.28 2.38 2.48

V

2.47 2.58 2.69

2.37 2.48 2.59

VPVD5

PVD threshold 5

VPVD6

PVD threshold 6

Rising edge

Falling edge

Rising edge

Falling edge

2.57 2.68 2.79

2.47 2.58 2.69

2.66 2.78 2.9

2.56 2.68 2.8

VPVD7

PVD threshold 7

VPVDhyst(2)

IDD(PVD)

PVD hysteresis

PVD current

consumption

Rising edge

Falling edge

2.76 2.88 3

2.66 2.78 2.9

-

100

-

mV

-

0.15 0.26 µA

1. Data based on characterization results only, not tested in production.

2. Guaranteed by design, not tested in production.

Embedded reference voltage

The parameters given in Table 26 are derived from tests performed under ambient

temperature and VDD supply voltage conditions summarized in Table 22.

Table 26. Embedded internal reference voltage

Symbol

Parameter

Conditions

Min Typ Max Unit

VREFINT

TS_vrefint

VRERINT

TCoeff

–40 °C < TA < +105 °C 1.16

Internal reference voltage

–40 °C < TA < +85 °C 1.16

ADC sampling time when

reading the internal

2.2

reference voltage

Internal reference voltage

spread over the

temperature range

VDD = 3 V ±10 mV

-

Temperature coefficient

-

1.2 1.25

V

1.2 1.24(1) V

-

-

µs

-

10(2)

mV

- 100(2) ppm/°C

60/133

Doc ID 023353 Rev 5

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