GS1582-IBE3 View Datasheet(PDF) - Semtech Corporation

Part Name

Description

Manufacturer

GS1582-IBE3

Multi-Rate Serializer with Cable Driver, Audio Multiplexer and ClockCleaner™

Semtech Corporation 

When the JTAG tests are applied by ATE, care must be taken to disable any other devices

driving the digital I/O pins. If the tests are to be applied only at ATE, this can be

accomplished with tri-state buffers used in conjunction with the JTAG/HOST input

signal. This is shown in Figure 4-31.

Application HOST

GS1582

CS_TMS

SCLK_TCK

SDIN_TDI

SDOUT_TDO

JTAG_HOST

In-circuit ATE probe

Figure 4-31: In-Circuit JTAG

Alternatively, if the test capabilities are to be used in the system, the host processor may

still control the JTAG/HOST input signal, but some means for tri-stating the host must

exist in order to use the interface at ATE. This is represented in Figure 4-32.

Application HOST

GS1582

CS_TMS

SCLK_TCK

SDIN_TDI

Tri-State

In-circuit ATE probe

Figure 4-32: System JTAG

SDOUT_TDO

JTAG_HOST

NOTE: Scan coverage is limited to digital pins only. There is no scan coverage for analog

pins VCO, SDO/SDO, RSET, LF, and CP_RES.

NOTE: The SD/HD pin must be held LOW during scan and therefore has no scan

coverage.

Please contact your Gennum representative to obtain the BSDL model for the GS1582.

GS1582 Multi-Rate Serializer with Cable Driver, Audio

Multiplexer and ClockCleanerTM

Data Sheet

40117 - 4

December 2011

107 of 115

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