LH28F800BGE-BL12 データシートの表示（PDF） - Sharp Electronics
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LH28F800BGE-BL12 Datasheet PDF : 43 Pages
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LH28F800BG-L/BGH-L (FOR TSOP, CSP)
6.2.4 AC CHARACTERISTICS - READ-ONLY OPERATIONS (contd.) (NOTE 1)
• VCC = 5.0±0.25 V, 5.0±0.5 V, TA = 0 to +70˚C or –40 to +85˚C
VERSIONS
(NOTE 4)
VCC±0.25 V LH28F800BG-L85
LH28F800BGH-L85
VCC±0.5 V
(NOTE 5)
(NOTE 5)
UNIT
LH28F800BG-L85 LH28F800BG-L12
LH28F800BGH-L85 LH28F800BGH-L12
SYMBOL
PARAMETER
tAVAV Read Cycle Time
tAVQV Address to Output Delay
tELQV CE# to Output Delay
tPHQV RP# High to Output Delay
tGLQV OE# to Output Delay
tELQX CE# to Output in Low Z
tEHQZ CE# High to Output in High Z
tGLQX OE# to Output in Low Z
tGHQZ OE# High to Output in High Z
Output Hold from Address,
tOH
CE# or OE# Change,
Whichever Occurs First
NOTE MIN.
85
2
2
3
0
3
3
0
3
3
0
MAX.
85
85
400
40
55
10
MIN.
90
0
0
0
MAX.
90
90
400
45
55
10
MIN.
120
0
0
0
MAX.
ns
120 ns
120 ns
400 ns
50 ns
ns
55 ns
ns
15 ns
ns
NOTES :
1. See AC Input/Output Reference Waveform (Fig. 7
through Fig. 9) for maximum allowable input slew rate.
2. OE# may be delayed up to tELQV-tGLQV after the falling
edge of CE# without impact on tELQV.
3. Sampled, not 100% tested.
4. See Fig. 8 "Transient Input/Output Reference
Waveform" and Fig. 10 "Transient Equivalent Testing
Load Circuit" (High Speed Configuration) for testing
characteristics.
5. See Fig. 9 "Transient Input/Output Reference
Waveform" and Fig. 10 "Transient Equivalent Testing
Load Circuit" (Standard Configuration) for testing
characteristics.
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