ST7PSCR1E4M1/XXX データシートの表示（PDF） - STMicroelectronics

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ST7PSCR1E4M1/XXX

8-BIT LOW-POWER, FULL-SPEED USB MCU WITH 16K FLASH, 768 RAM, SMARTCARD I/F, TIMER

STMicroelectronics 

ST7SCR

EMC CHARACTERISTICS (Cont’d)

14.7.2.3 Static and Dynamic Latch-Up

s LU: 3 complementary static tests are required

on 10 parts to assess the latch-up performance.

A supply overvoltage (applied to each power

supply pin), a current injection (applied to each

input, output and configurable I/O pin) and a

power supply switch sequence are performed

on each sample. This test conforms to the EIA/

JESD 78 IC latch-up standard. For more details,

refer to the AN1181 ST7 application note.

s DLU: Electro-Static Discharges (one positive

then one negative test) are applied to each pin

of 3 samples when the micro is running to

assess the latch-up performance in dynamic

mode. Power supplies are set to the typical

values, the oscillator is connected as near as

possible to the pins of the micro and the

component is put in reset mode. This test

conforms to the IEC1000-4-2 and SAEJ1752/3

standards and is described in Figure 41. For

more details, refer to the AN1181 ST7

application note.

Electrical Sensitivities

Symbol

LU

DLU

Parameter

Static latch-up class

Dynamic latch-up class

Conditions

TA=+25°C

VDD=5.5V, fOSC=4MHz, TA=+25°C

Class 1)

A

A

Figure 41. Simplified Diagram of the ESD Generator for DLU

RCH=50MΩ

CS=150pF

ESD

GENERATOR 2)

RD=330Ω

DISCHARGE TIP

VDD

HV RELAY

VSS

ST7

DISCHARGE

RETURN CONNECTION

Notes:

1. Class description: A Class is an STMicroelectronics internal specification. All its limits are higher than the JEDEC spec-

ifications, that means when a device belongs to Class A it exceeds the JEDEC standard. B Class strictly covers all the

JEDEC criteria (international standard).

2. Schaffner NSG435 with a pointed test finger.

86/102

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