STM32F217RGT7 데이터 시트보기 (PDF) - STMicroelectronics
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STM32F217RGT7 Datasheet PDF : 173 Pages
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Electrical characteristics
STM32F21xxx
Table 41. Electrical sensitivities
Symbol
Parameter
Conditions
LU
Static latch-up class
TA = +105 °C conforming to JESD78A
Class
II level A
5.3.15
I/O current injection characteristics
As a general rule, current injection to the I/O pins, due to external voltage below VSS or
above VDD (for standard, 3 V-capable I/O pins) should be avoided during normal product
operation. However, in order to give an indication of the robustness of the microcontroller in
cases when abnormal injection accidentally happens, susceptibility tests are performed on a
sample basis during device characterization.
Functional susceptibilty to I/O current injection
While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into the
I/O pin, one at a time, the device is checked for functional failures.
The failure is indicated by an out of range parameter: ADC error above a certain limit (>5
LSB TUE), out of spec current injection on adjacent pins or other functional failure (for
example reset, oscillator frequency deviation).
The test results are given in Table 42.
Table 42. I/O current injection susceptibility
Symbol
Description
Functional susceptibility
Negative
Positive
Unit
injection
injection
Injected current on all FT pins
IINJ
Injected current on any other pin
–5
+0
mA
–5
+5
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Doc ID 17050 Rev 8
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