LH28F160S5T-L80 查看數據表（PDF） - Sharp Electronics
零件编号
产品描述 (功能)
生产厂家
LH28F160S5T-L80
Sharp Electronics
LH28F160S5T-L80 Datasheet PDF : 55 Pages
| |||
LH28F160S5-L/S5H-L
6.2.4 AC CHARACTERISTICS - READ-ONLY OPERATIONS (contd.) (NOTE1)
[LH28F160S5H-L]
• VCC = 5.0±0.25 V, 5.0±0.5V, TA = –40 to +85°C
VERSIONS
VCC±0.25 V
(NOTE 4)
LH28F160S5H-L70
VCC±0.5 V
(NOTE 5)
(NOTE 5)
UNIT
LH28F160S5H-L70 LH28F160S5H-L10
SYMBOL
PARAMETER
NOTE MIN.
tAVAV Read Cycle Time
70
tAVQV Address to Output Delay
tELQV CE# to Output Delay
2
tPHQV RP# High to Output Delay
tGLQV OE# to Output Delay
2
tELQX CE# to Output in Low Z
3
0
tEHQZ CE# High to Output in High Z
3
tGLQX OE# to Output in Low Z
3
0
tGHQZ OE# High to Output in High Z
3
Output Hold from Address,
tOH
CE# or OE# Change,
3
0
Whichever Occurs First
tFLQV
BYTE# to Output Delay
3
tFHQV
tFLQZ BYTE# to Output in High Z
3
tELFL CE# Low to BYTE#
3
tELFH High or Low
NOTES :
1. See AC Input/Output Reference Waveform (Fig. 12 and
Fig. 13) for maximum allowable input slew rate.
2. OE# may be delayed up to tELQV-tGLQV after the falling
edge of CE# without impact on tELQV.
3. Sampled, not 100% tested.
4. See Fig. 12 "Transient Input/Output Reference
Waveform" and Fig. 14 "Transient Equivalent Testing
Load Circuit" (High Speed Configuration) for testing
characteristics.
MAX.
70
70
400
30
25
10
MIN.
90
0
0
MAX.
90
90
400
35
30
10
MIN.
100
0
0
MAX.
ns
100 ns
100 ns
400 ns
40 ns
ns
35 ns
ns
15 ns
0
0
ns
70
90
100 ns
25
30
30 ns
5
5
5
ns
5. See Fig. 13 "Transient Input/Output Reference
Waveform" and Fig. 14 "Transient Equivalent Testing
Load Circuit" (Standard Configuration) for testing
characteristics.
- 40 -
Share Link: 