STM32F100RCT6BTR 查看數據表（PDF） - STMicroelectronics

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STM32F100RCT6BTR

High-density value line, advanced ARM-based 32-bit MCU with 256 to 512 KB Flash, 16 timers, ADC, DAC & 11 comm interfaces

STMicroelectronics 

Electrical characteristics

STM32F100xC, STM32F100xD, STM32F100xE

5.3.13

I/O current injection characteristics

As a general rule, current injection to the I/O pins, due to external voltage below VSS or

above VDD (for standard, 3 V-capable I/O pins) should be avoided during normal product

operation. However, in order to give an indication of the robustness of the microcontroller in

cases when abnormal injection accidentally happens, susceptibility tests are performed on a

sample basis during device characterization.

Functional susceptibilty to I/O current injection

While a simple application is executed on the device, the device is stressed by injecting

current into the I/O pins programmed in floating input mode. While current is injected into the

I/O pin, one at a time, the device is checked for functional failures.

The failure is indicated by an out of range parameter: ADC error above a certain limit (>5

LSB TUE), out of spec current injection on adjacent pins or other functional failure (for

example reset, oscillator frequency deviation).

The test results are given in Table 42

Table 42. I/O current injection susceptibility

Symbol

Description

Functional susceptibility

Negative

Positive

Unit

injection

injection

Injected current on OSC_IN32,

OSC_OUT32, PA4, PA5, PC13

IINJ

Injected current on all FT pins

Injected current on any other pin

-0

+0

-5

+0

mA

-5

+5

68/98

Doc ID 15081 Rev 7

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