DatasheetQ Logo
Electronic component search and free download site. Transistors,MosFET ,Diode,Integrated circuits

STM32F038C6T6 查看數據表(PDF) - STMicroelectronics

零件编号
产品描述 (功能)
生产厂家
STM32F038C6T6 Datasheet PDF : 102 Pages
First Prev 51 52 53 54 55 56 57 58 59 60 Next Last
Electrical characteristics
STM32F038x6
6.3.10
Symbol
Table 38. Flash memory endurance and data retention
Parameter
Conditions
Min(1)
NEND Endurance
TA = –40 to +105 °C
10
1 kcycle(2) at TA = 85 °C
30
tRET Data retention
1 kcycle(2) at TA = 105 °C
10
10 kcycle(2) at TA = 55 °C
20
1. Data based on characterization results, not tested in production.
2. Cycling performed over the whole temperature range.
Unit
kcycle
Year
EMC characteristics
Susceptibility tests are performed on a sample basis during device characterization.
Functional EMS (electromagnetic susceptibility)
While a simple application is executed on the device (toggling 2 LEDs through I/O ports).
the device is stressed by two electromagnetic events until a failure occurs. The failure is
indicated by the LEDs:
Electrostatic discharge (ESD) (positive and negative) is applied to all device pins until
a functional disturbance occurs. This test is compliant with the IEC 61000-4-2 standard.
FTB: A Burst of Fast Transient voltage (positive and negative) is applied to VDD and
VSS through a 100 pF capacitor, until a functional disturbance occurs. This test is
compliant with the IEC 61000-4-4 standard.
A device reset allows normal operations to be resumed.
The test results are given in Table 39. They are based on the EMS levels and classes
defined in application note AN1709.
Table 39. EMS characteristics
Symbol
Parameter
Conditions
VFESD
VEFTB
Voltage limits to be applied on any I/O pin
to induce a functional disturbance
VDD = 1.8 V, LQFP48, TA = +25 °C,
fHCLK = 48 MHz,
conforming to IEC 61000-4-2
Fast transient voltage burst limits to be VDD = 1.8 V, LQFP48, TA = +25°C,
applied through 100 pF on VDD and VSS fHCLK = 48 MHz,
pins to induce a functional disturbance conforming to IEC 61000-4-4
Level/
Class
2B
4B
Designing hardened software to avoid noise problems
EMC characterization and optimization are performed at component level with a typical
application environment and simplified MCU software. It should be noted that good EMC
performance is highly dependent on the user application and the software in particular.
Therefore it is recommended that the user applies EMC software optimization and
prequalification tests in relation with the EMC level requested for his application.
60/102
DocID026079 Rev 5

Share Link: 

datasheetq.com  [ Privacy Policy ]Request Datasheet ] [ Contact Us ]