STM32F302RBT7TR 查看數據表（PDF） - STMicroelectronics

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STM32F302RBT7TR

ARM Cortex-M4F 32b MCU+FPU, up to 256KB Flash+48KB SRAM 4 ADCs, 2 DAC ch., 7 comp, 4 PGA, timers, 2.0-3.6 V operation

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Electrical characteristics

STM32F302xx/STM32F303xx

Table 69. ADC accuracy (1)(2)(3) (continued)

Symbol Parameter

Conditions

Min (4) Max(4) Unit

Signal-to-

SINAD noise and

distortion ratio

Fast channel 5.1 Ms

-

63

Single Ended

Slow channel 4.8 Ms

-

63

Fast channel 5.1 Ms

-

67

Differential

Slow channel 4.8 Ms

-

67

SNR

Signal-to-

noise ratio

Fast channel 5.1 Ms 64

ADC clock freq.

Single Ended

≤ 72 MHz,

Slow channel 4.8 Ms 64

Sampling freq. ≤ 5

Msps,

2V ≤ VDDA , VREF+ ≤

3.6 V

Fast channel 5.1 Ms 67

Differential

Slow channel 4.8 Ms 67

-

-

dB

-

-

THD

Total

harmonic

distortion

Fast channel 5.1 Ms

-

−71

Single Ended

Slow channel 4.8 Ms

-

−69

Fast channel 5.1 Ms

-

−73

Differential

Slow channel 4.8 Ms

-

−70

1. ADC DC accuracy values are measured after internal calibration.

2. ADC accuracy vs. negative Injection Current: Injecting negative current on any analog input pins should be avoided as this

significantly reduces the accuracy of the conversion being performed on another analog input. It is recommended to add a

Schottky diode (pin to ground) to analog pins which may potentially inject negative current.

Any positive injection current within the limits specified for IINJ(PIN) and ΣIINJ(PIN) in Section 6.3.14 does not affect the ADC

accuracy.

3. Better performance may be achieved in restricted VDDA, frequency and temperature ranges.

4. Data based on characterization results, not tested in production.

Figure 32. ADC accuracy characteristics

[1LSBIDEAL

=VREF+

4096

(or

VDDA depending

4096

on

package)]

EG

4095

4094

4093

(2)

7

ET

(3)

(1)

6

5

EO

EL

4

3

ED

2

1

1 LSBIDEAL

(1) Example of an actual transfer curve

(2) The ideal transfer curve

(3) End point correlation line

ET=Total Unadjusted Error: maximum deviation

between the actual and the ideal transfer curves.

EO=Offset Error: deviation between the first actual

transition and the first ideal one.

EG=Gain Error: deviation between the last ideal

transition and the last actual one.

ED=Differential Linearity Error: maximum deviation

between actual steps and the ideal one.

EL=Integral Linearity Error: maximum deviation

between any actual transition and the end point

correlation line.

0

1234567

VSSA

4093 4094 4095 4096

VDDA

ai14395b

110/133

Doc ID 023353 Rev 5

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