GAL16LV8C-10LJ View Datasheet(PDF) - Lattice Semiconductor
Part Name
Description
Manufacturer
GAL16LV8C-10LJ Datasheet PDF : 22 Pages
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GAL16LV8D: Switching Test Conditions
Input Pulse Levels
Input Rise and Fall Times
Input Timing Reference Levels
Output Timing Reference Levels
Output Load
GND to 3.0V
1.5ns 10% – 90%
1.5V
1.5V
See Figure
GAL16LV8D Output Load Conditions (see figure)
Test Condition
R1
CL
A
50Ω
35pF
B High Z to Active High at 1.9V
50Ω
35pF
High Z to Active Low at 1.0V
50Ω
35pF
C Active High to High Z at 1.9V
50Ω
35pF
Active Low to High Z at 1.0V
50Ω
35pF
GAL16LV8C: Switching Test Conditions
Input Pulse Levels
Input Rise and Fall Times
Input Timing Reference Levels
Output Timing Reference Levels
Output Load
GND to 3.0V
1.5ns 10% – 90%
1.5V
1.5V
See Figure
3-state levels are measured 0.5V from steady-state active
level.
GAL16LV8C Output Load Conditions (see figure)
Test Condition
R1
R2
CL
A
B Active High
Active Low
C Active High
Active Low
316Ω
316Ω
316Ω
316Ω
316Ω
348Ω
348Ω
348Ω
348Ω
348Ω
35pF
35pF
35pF
5pF
5pF
Specifications GAL16LV8
+1.45V
TEST POINT
R1
FROM OUTPUT (O/Q)
UNDER TEST
Z0 = 50Ω, CL = 35pF*
*CL INCLUDES TEST FIXTURE AND PROBE CAPACITANCE
+3.3V
R1
FROM OUTPUT (O/Q)
UNDER TEST
R2
TEST POINT
C L*
*C L INCLUDES TEST FIXTURE AND PROBE CAPACITANCE
16
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