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ST72324BLJ2B5 View Datasheet(PDF) - STMicroelectronics

Part Name
Description
Manufacturer
ST72324BLJ2B5 Datasheet PDF : 154 Pages
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ST72324Lxx
12.7.2 Electro Magnetic Interference (EMI)
Based on a simple application running on the
product (toggling 2 LEDs through the I/O ports),
the product is monitored in terms of emission. This
emission test is in line with the norm SAE J 1752/
3 which specifies the board and the loading of
each pin.
Symbol
Parameter
Conditions
Monitored
Frequency Band
SEMI Peak level
SEMI Peak level
Flash device: VDD=3.3V,
TA=+25°C,
0.1MHz to 30MHz
30MHz to 130MHz
LQFP44 package
130MHz to 1GHz
conforming to SAE J 1752/3 SAE EMI Level
ROM device: VDD=3.3V,
TA=+25°C,
0.1MHz to 30MHz
30MHz to 130MHz
LQFP44 package
130MHz to 1GHz
conforming to SAE J 1752/3 SAE EMI Level
Notes:
1. Data based on characterization results, not tested in production.
Max vs. [fOSC/fCPU]
8/4MHz 16/8MHz
14
15
18
23
16
22
3.0
3.5
8
4
16
20
8
14
2.5
3.0
Unit
dBµV
-
dBµV
-
122/154
1

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