STM8S005K6 STM8S005C6
Electrical characteristics
Table 35: Flash program memory/data EEPROM memory
Symbol Parameter
Conditions Min(1) Typ Max Unit
VDD Operating voltage (all modes,
execution/write/erase)
fCPU ≤ 16 MHz 2.95
5.5 V
tprog Standard programming time
(including erase) for
byte/word/block (1 byte/4
bytes/128 bytes)
6.0 6.6 ms
Fast programming time for 1 block
(128 bytes)
3.0 3.3 ms
terase Erase time for 1 block (128 bytes)
NRW
Erase/write cycles(2)(program
memory)
TA = 85 °C
3.0 3.3 ms
100
cycles
Erase/write cycles(data memory)(2) TA = 85 ° C
100 k
tRET Data retention (program memory) TRET = 55° C 20
after 100 erase/write cycles at TA
= 85 °C
years
Data retention (data memory) after
20
10 k erase/write cycles at TA = 85
°C
Data retention (data memory) after TRET = 85° C 1
100 k erase/write cyclesat TA = 85
°C
IDD
Supply current (Flash
programming or erasing for 1 to
128 bytes)
2.0
mA
(1) Data based on characterization results, not tested in production.
(2) The physical granularity of the memory is 4 bytes, so cycling is performed on 4 bytes
even when a write/erase operation addresses a single byte.
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