ST7LITE1xB
13.8 I/O PORT PIN CHARACTERISTICS
13.8.1 General Characteristics
Subject to general operating conditions for VDD, fOSC, and TA unless otherwise specified.
Symbol
Parameter
Conditions
Min
Typ
Max
VIL Input low level voltage
VIH Input high level voltage
Vhys
Schmitt trigger voltage
hysteresis 1)
IL
Input leakage current
VSS≤VIN≤VDD
Static current consumption in-
IS
duced by each floating input Floating input mode
pin2)
VSS - 0.3
0.7xVDD
0.3xVDD
VDD + 0.3
400
±1
400
RPU
CIO
tf(IO)out
tr(IO)out
tw(IT)in
Weak pull-up equivalent
resistor3)
I/O pin capacitance
VIN=VSS
VDD=5V
VDD=3V
Output high to low level fall
time 1)
Output low to high level rise
time 1)
CL=50pF
Between 10% and 90%
External interrupt pulse time 4)
50
120
250
160
5
25
25
1
Unit
V
mV
μA
kΩ
pF
ns
tCPU
Notes:
1. Data based on validation/design results.
2. Configuration not recommended, all unused pins must be kept at a fixed voltage: using the output mode of the I/O for
example or an external pull-up or pull-down resistor (see Figure 80). Static peak current value taken at a fixed VIN value,
based on design simulation and technology characteristics, not tested in production. This value depends on VDD and tem-
perature values.
3. The RPU pull-up equivalent resistor is based on a resistive transistor.
4. To generate an external interrupt, a minimum pulse width has to be applied on an I/O port pin configured as an external
interrupt source.
Figure 80. Two typical Applications with unused I/O Pin
VDD
10kΩ
ST7XXX
UNUSED I/O PORT
10kΩ
UNUSED I/O PORT
ST7XXX
Caution: During normal operation the ICCCLK pin must be pulled-up, internally or externally
(external pull-up of 10k mandatory in noisy environment). This is to avoid entering ICC mode unexpectedly during a reset.
Note: I/O can be left unconnected if it is configured as output (0 or 1) by the software. This has the advantage of greater EMC
robustness and lower cost.
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