STPCD01 查看數據表（PDF） - STMicroelectronics

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STPCD01

PC Compatible Embedded Microprocessor

STMicroelectronics 

ELECTRICAL SPECIFICATIONS

4. ELECTRICAL SPECIFICATIONS

4.1 INTRODUCTION

The electrical specifications in this chapter are val-

id for the STPC Client.

4.2 ELECTRICAL CONNECTIONS

4.2.1 POWER/GROUND CONNECTIONS/

DECOUPLING

Due to the high frequency of operation of the

STPC Client, it is necessary to install and test this

device using standard high frequency techniques.

The high clock frequencies used in the STPC Cli-

ent and its output buffer circuits can cause tran-

sient power surges when several output buffers

switch output levels simultaneously. These effects

can be minimized by filtering the DC power leads

with low-inductance decoupling capacitors, using

low impedance wiring, and by utilizing all of the

VSS and VDD pins.

4.2.2 UNUSED INPUT PINS

All inputs not used by the designer and not listed

in the table of pin connections in Chapter 3 should

be connected either to VDD or to VSS. Connect

active-high inputs to VDD through a 20 kW

(±10%) pull-down resistor and active-low inputs to

VSS and connect active-low inputs to VCC

Table 4-1. Absolute Maximum Ratings

Symbol

VDDx

VI, VO

V5T

VESD

TSTG

TCASE

PTOT

Parameter

DC Supply Voltage

Digital Input and Output Voltage

5Volt Tolerance

ESD Capacity (Human body mode)

Storage Temperature

Operating Case Temperature (Note 1)

Total Power Dissipation

Note 1 : -40°C limit of TCASE (extended temperature

range) is given a s a preliminary specification and so as

all the -40°C related data.

through a 20 kW (±10%) pull-up resistor to pre-

vent spurious operation.

4.2.3 RESERVED DESIGNATED PINS

Pins designated reserved should be left discon-

nected. Connecting a reserved pin to a pull-up re-

sistor, pull-down resistor, or an active signal could

cause unexpected results and possible circuit

malfunctions.

4.3 ABSOLUTE MAXIMUM RATINGS

The following table lists the absolute maximum

ratings for the STPC Client device. Stresses be-

yond those listed under Table 4-1 limits may

cause permanent damage to the device. These

are stress ratings only and do not imply that oper-

ation under any conditions other than those spec-

ified in section ”Operating Conditions”.

Exposure to conditions beyond Table 4-1 may (1)

reduce device reliability and (2) result in prema-

ture failure even when there is no immediately ap-

parent sign of failure. Prolonged exposure to con-

ditions at or near the absolute maximum ratings

(Table 4-1) may also result in reduced useful life

and reliability.

Min imum

-0.3

-0.3

2.5

-40

-40

Maximum

4.0

VDD + 0.3

5

1500

+150

+100

4.8

Units

V

V

V

V

°C

°C

W

30/48

Issue 1.7 - February 8, 2000

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