ATSAMA5D35A-CU View Datasheet(PDF) - Atmel Corporation

Part Name

Description

Manufacturer

ATSAMA5D35A-CU

SMART ARM-based MPU

Atmel Corporation 

10.4.2 Test Environment

Figure 10-3 shows a test environment example. Test vectors are sent and interpreted by the tester. In this

example, the “board in test” is designed using a number of JTAG-compliant devices. These devices can be

connected to form a single scan chain.

Figure 10-3. Application Test Environment Example

Test Adaptor

Tester

JTAG

Interface

ICE/JTAG Chip n

Chip 2

SAM device

Chip 1

SAM-based Application Board In Test

SAMA5D3 Series [DATASHEET]

55

Atmel-11121F-ATARM-SAMA5D3-Series-Datasheet_02-Feb-16

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