Intel® Quark SoC X1000—Electrical Characteristics
Figure 8. USB EOP Width
Tperiod
Differential
Data Lines
4.8
4.8.1
General Interface Timing
Legacy SPI Interface Timing
Data
Crossover
Level
EOP
Width
Table 36.
4.8.2
Legacy SPI Interface Timings (20 MHz)
Sym
Parameter
Min
Max
Units
Notes Fig
F
Serial Clock Frequency - 20M Hz Operation
—
20
MHz
TCH
LSPI_SCK high time
20
—
ns
9
TCL
LSPI_SCK low time
30
—
ns
9
TDSCR
Setup of LSPI_MISO with respect to
LPSI_SCK rising edge
11.7
—
ns
9
TCRDH
Hold time of LSPI_MISO with respect to
LPSI_SCK rising edge
-3.0
—
ns
9
TCFDV
LSPI_SCK falling edge to LSPI_MOSI valid
-1.9
2.5
ns
9
TCFSF
LSPI_SCK falling edge to LSPI_SS_B low
-1.6
2.4
ns
9
TCFSR
LSPI_SCK falling edge to LSPI_SS_B high
-1.7
2.3
ns
9
Note:
1.
2.
3.
All input signals have a slope of 1.0ns measured between 20%and 80% VCC values
All output signals are loaded with 20pF
Measurements are made at 50% VCC levels
SPI0/1 Interface Timing
Table 37.
SPI0/1 Interface Timings (25 MHz)
Sym
F
TCH
TCL
TDSCR
TCRDH
TCFDV
Parameter
Serial Clock Frequency - 25MHz Operation
SPI0/1_SCK high time
SPI0/1_SCK low time
Setup of SPI0/1_MISO with respect to SPI0/
1_SCK capturing edge
Hold time of SPI0/1_MISO with respect to
SPI0/1_SCK capturing edge
SPI0/1_SCK driving edge to SPI0/1_MOSI
valid
Min
—
20
20
10.7
-2.5
-0.8
Max
Units Notes
Fig
25
MHz
—
ns
9
—
ns
9
—
ns
9
—
ns
9
3.5
ns
9
Intel® Quark SoC X1000
DS
78
October 2013
Document Number: 329676001US