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STP16N50M2(2018) View Datasheet(PDF) - STMicroelectronics

Part Name
Description
Manufacturer
STP16N50M2 Datasheet PDF : 24 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
STD16N50M2, STF16N50M2, STP16N50M2
Electrical characteristics
Table 7. Source-drain diode
Symbol
Parameter
Test conditions
ISD
ISDM (1)
VSD (2)
trr
Qrr
IRRM
Source-drain current
Source-drain current (pulsed)
Forward on voltage
Reverse recovery time
Reverse recovery charge
Reverse recovery current
VGS = 0 V, ISD = 13 A
ISD = 13 A, di/dt = 100 A/µs,
VDD = 60 V (see
Figure 19. Test circuit for
inductive load switching and
diode recovery times )
trr
Qrr
IRRM
Reverse recovery time
Reverse recovery charge
Reverse recovery current
ISD = 13 A, di/dt = 100 A/µs,
VDD = 60 V, Tj = 150 °C (see
Figure 19. Test circuit for
inductive load switching and
diode recovery times )
1. Pulse width is limited by safe operating area.
2. Pulse test: pulse duration = 300 µs, duty cycle 1.5%.
Min.
-
-
-
-
-
-
-
-
-
Typ.
280
2.85
20.5
388
4.5
21
Max.
13
52
1.6
Unit
A
A
V
ns
µC
A
ns
µC
A
DS10450 - Rev 6
page 4/24

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