ST7PLITEU09M3TR View Datasheet(PDF) - STMicroelectronics

Part Name

Description

Manufacturer

ST7PLITEU09M3TR

8-bit MCU with single voltage Flash memory, ADC, timers

STMicroelectronics 

ST7LITEU05 ST7LITEU09

EMC CHARACTERISTICS (Cont’d)

13.7.3.2 Static and Dynamic Latch-Up

■ LU: 3 complementary static tests are required

on 10 parts to assess the latch-up performance.

A supply overvoltage (applied to each power

supply pin) and a current injection (applied to

each input, output and configurable I/O pin) are

performed on each sample. This test conforms

to the EIA/JESD 78 IC latch-up standard. For

more details, refer to the application note

AN1181.

■ DLU: Electro-Static Discharges (one positive

then one negative test) are applied to each pin

of 3 samples when the micro is running to

assess the latch-up performance in dynamic

mode. Power supplies are set to the typical

values, the oscillator is connected as near as

possible to the pins of the micro and the

component is put in reset mode. This test

conforms to the IEC1000-4-2 and SAEJ1752/3

standards. For more details, refer to the

application note AN1181.

Electrical Sensitivities

Symbol

LU

DLU

Parameter

Static latch-up class

Dynamic latch-up class

Conditions

TA=+125°C

VDD=5.5V, fOSC=4MHz, TA=+25°C

Class 1)

A

A

Note:

1. Class description: A Class is an STMicroelectronics internal specification. All its limits are higher than the JEDEC spec-

ifications, that means when a device belongs to Class A it exceeds the JEDEC standard. B Class strictly covers all the

JEDEC criteria (international standard).

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