STM32WB55CEV7 View Datasheet(PDF) - STMicroelectronics

Part Name

Description

Manufacturer

STM32WB55CEV7

Multiprotocol wireless 32-bit MCU Arm®-based Cortex®-M4 with FPU, Bluetooth® 5 and 802.15.4 radio solution

STMicroelectronics 

STM32WB55xx STM32WB35xx

Electrical characteristics

Symbol

Table 82. ADC accuracy - Limited test conditions 4(1)(2)(3) (continued)

Parameter

Conditions(4)

Min Typ Max Unit

THD

Total

harmonic

distortion

Single

ended

Fast channel (max speed)

Slow channel (max speed)

Differential

Fast channel (max speed)

Slow channel (max speed)

- -71 -69

- -71 -69

dB

- -73 -72

- -73 -72

1. Guaranteed by design.

2. ADC DC accuracy values are measured after internal calibration.

3. ADC accuracy vs. negative Injection Current: Injecting negative current on any analog input pins should be avoided as this

significantly reduces the accuracy of the conversion being performed on another analog input. It is recommended to add a

Schottky diode (pin to ground) to analog pins that may potentially inject negative current.

4.

The I/O

VDDA <

analog

2.4 V).

switch voltage booster is

It is disabled when VDDA

≥en2a.4blVe.dNwohoevneVrsDaDmAp<lin2g.4.

V

(BOOSTEN

=

1

in

the

SYSCFG_CFGR1

when

Figure 29. ADC accuracy characteristics

4095

4094

4093

7

6

5

4

3

2

1

(2)

ET

EL

EO

ED

1 LSB ideal

12 345 67

EG

(3)

(1)

4093 4094 4095 4096

(1) Example of an actual transfer curve

(2) Ideal transfer curve

(3) End point correlation line

ET = Total unadjusted error: maximum deviation

between actual and ideal transfer curves

EO = Offset error: maximum deviation between the

first actual transition and the first ideal one

EG = Gain error: deviation between the last ideal

transition and the last actual one

ED = Differential linearity error: maximum

deviation between actual steps and the ideal ones

EL = Integral linearity error: maximum deviation

between any actual transition and the end point

correlation line

VREF+/4096

MS54001V1

DS11929 Rev 10

151/193

169

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