PCA85176(2010) View Datasheet(PDF) - NXP Semiconductors.
Part Name
Description
Manufacturer
PCA85176 Datasheet PDF : 44 Pages
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NXP Semiconductors
PCA85176
Universal LCD driver for low multiplex rates
11. Dynamic characteristics
Table 17. Dynamic characteristics
VDD = 1.8 V to 5.5 V; VSS = 0 V; VLCD = 2.5 V to 8.0 V; Tamb = −40 °C to +95 °C; unless otherwise specified.
Symbol Parameter
Conditions
Min
Typ
Max
Clock
fclk(int)
internal clock frequency
PCA85176H [1]
PCA85176T [1]
1 440
1 920
1 970
2 640
2 640
3 600
fclk(ext)
ffr
external clock frequency
frame frequency
internal clock
PCA85176H
960
-
60
82
4 800
110
PCA85176T
80
110
150
external clock
40
-
200
tclk(H)
HIGH-level clock time
tclk(L)
LOW-level clock time
Synchronization
60
-
-
60
-
-
tPD(SYNC_N)
tSYNC_NL
tPD(drv)
I2C-bus[3]
SYNC propagation delay
SYNC LOW time
driver propagation delay
-
1
VLCD = 5 V
[2]
-
30
-
-
-
-
30
Pin SCL
fSCL
tLOW
tHIGH
Pin SDA
SCL clock frequency
LOW period of the SCL clock
HIGH period of the SCL clock
-
-
400
1.3
-
-
0.6
-
-
tSU;DAT
data set-up time
tHD;DAT
data hold time
Pins SCL and SDA
100
-
-
0
-
-
tBUF
bus free time between a STOP and
START condition
1.3
-
-
tSU;STO
tHD;STA
tSU;STA
set-up time for STOP condition
hold time (repeated) START condition
set-up time for a repeated START
condition
0.6
-
-
0.6
-
-
0.6
-
-
tr
rise time of both SDA and SCL signals fSCL = 400 kHz
-
-
0.3
fSCL < 125 kHz
-
-
1.0
tf
fall time of both SDA and SCL signals
-
-
0.3
Cb
capacitive load for each bus line
-
-
400
tw(spike)
spike pulse width
on the I2C-bus
-
-
50
Unit
Hz
Hz
Hz
Hz
Hz
Hz
μs
μs
ns
μs
μs
kHz
μs
μs
ns
ns
μs
μs
μs
μs
μs
μs
μs
pF
ns
[1] Typical output duty factor: 50 % measured at the CLK output pin.
[2] Not tested in production.
[3] All timing values are valid within the operating supply voltage and ambient temperature range and are referenced to VIL and VIH with an
input voltage swing of VSS to VDD.
PCA85176_1
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 01 — 14 April 2010
© NXP B.V. 2010. All rights reserved.
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