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M48T212VMH View Datasheet(PDF) - STMicroelectronics

Part Name
Description
Manufacturer
M48T212VMH
STMICROELECTRONICS
STMicroelectronics 
M48T212VMH Datasheet PDF : 35 Pages
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M48T212V
Figure 11. Calibration waveform
NORMAL
POSITIVE
CALIBRATION
NEGATIVE
CALIBRATION
Clock operation
AI00594B
3.13
VCC noise and negative going transients
ICC transients, including those produced by output switching, can produce voltage
fluctuations, resulting in spikes on the VCC bus. These transients can be reduced if
capacitors are used to store energy which stabilizes the VCC bus. The energy stored in the
bypass capacitors will be released as low going spikes are generated or energy will be
absorbed when overshoots occur. A ceramic bypass capacitor value of 0.1µF (as shown in
Figure 12) is recommended in order to provide the needed filtering.
In addition to transients that are caused by normal SRAM operation, power cycling can
generate negative voltage spikes on VCC that drive it to values below VSS by as much as
one volt. These negative spikes can cause data corruption in the SRAM while in battery
backup mode. To protect from these voltage spikes, STMicroelectronics recommends
connecting a Schottky diode from VCC to VSS (cathode connected to VCC, anode to VSS).
Schottky diode 1N5817 is recommended for through hole and MBRS120T3 is
recommended for surface mount.
Figure 12. Supply voltage protection
VCC
VCC
0.1μF
DEVICE
VSS
AI02169
25/35

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