Preliminary Technical Data
150
100
50
TBD
0
–50
–100
–150
0
0.5
1.0
1.5
2.0
SOURCE VOLTAGE (V)
2.5
3.0
Figure 44. Drive Current F (High VDDEXT)
POWER DISSIPATION
Total power dissipation has two components: one due to inter-
nal circuitry (PINT) and one due to the switching of external
output drivers (PEXT).
See the ADSP-BF51x Blackfin Processor Hardware Reference
Manual for definitions of the various operating modes and for
instructions on how to minimize system power.
Many operating conditions can affect power dissipation. System
designers should refer to (EE-TBD) Estimating Power for
ADSP-BF512/BF514/BF516/BF518(F) Blackfin Processors on the
Analog Devices website (www.analog.com)—use site search on
“EE-TBD.” That document provides detailed information for
optimizing your design for lowest power.
TEST CONDITIONS
All timing parameters appearing in this data sheet were mea-
sured under the conditions described in this section. Figure 45
shows the measurement point for AC measurements (except
output enable/disable). The measurement point VMEAS is VDDEXT/2
or VDDMEM/2 for V /V DDEXT DDMEM (nominal) = 2.5 V/3.3 V.
INPUT
OR
OUTPUT
VMEAS
VM EA S
Figure 45. Voltage Reference Levels for AC
Measurements (Except Output Enable/Disable)
Output Enable Time Measurement
Output signals are considered to be enabled when they have
made a transition from a high impedance state to the point
when they start driving.
ADSP-BF512/BF514/BF516/BF518 (F)
The output enable time tENA is the interval from the point when a
reference signal reaches a high or low voltage level to the point
when the output starts driving as shown on the right side of
Figure 46.
tDIS
VOH
(MEASURED)
VOL
(MEASURED)
REFERENCE
SIGNAL
tDIS_MEASURED
tENA
VOH (MEASURED) ؊ ⌬V
VOL (MEASURED) + ⌬V
tDECAY
tENA _MEASURED
VOH(MEASURED)
VTRIP(HIGH)
VTRIP(LOW)
VOL(MEASURED)
tTRIP
OUTPUT STOPS DRIVING
OUTPUT STARTS DRIVING
HIGH IMPEDANCE STATE
Figure 46. Output Enable/Disable
The time tENA_MEASURED is the interval, from when the reference sig-
nal switches, to when the output voltage reaches VTRIP(high) or
VTRIP(low). VTRIP(high) is 2.0 V and VTRIP(low) is 1.0 V for
VDDEXT/VDDMEM (nominal) = 2.5 V/3.3 V. Time tTRIP is the interval
from when the output starts driving to when the output reaches
the VTRIP(high) or VTRIP(low) trip voltage.
Time tENA is calculated as shown in the equation:
tENA = tENA_MEASURED – tTRIP
If multiple signals (such as the data bus) are enabled, the mea-
surement value is that of the first signal to start driving.
Output Disable Time Measurement
Output signals are considered to be disabled when they stop
driving, go into a high impedance state, and start to decay from
their output high or low voltage. The output disable time tDIS is
the difference between tDIS_MEASURED and tDECAY as shown on the left
side of Figure 46.
tDIS = tDIS_MEASURED – tDECAY
The time for the voltage on the bus to decay by ΔV is dependent
on the capacitive load CL and the load current IL. This decay time
can be approximated by the equation:
tDECAY = (CLΔV) ⁄ IL
The time tDECAY is calculated with test loads CL and IL, and with
ΔV equal to 0.5 V for VDDEXT/VDDMEM (nominal) = 2.5 V/3.3 V.
The time tDIS_MEASURED is the interval from when the reference sig-
nal switches, to when the output voltage decays ΔV from the
measured output high or output low voltage.
Example System Hold Time Calculation
To determine the data output hold time in a particular system,
first calculate tDECAY using the equation given above. Choose ΔV
to be the difference between the ADSP-
Rev. PrE | Page 51 of 62 | March 2009