ADSP-BF512/BF514/BF516/BF518 (F)
BF512/BF514/BF516/BF518(F) processor’s output voltage and
the input threshold for the device requiring the hold time. CL is
the total bus capacitance (per data line), and IL is the total leak-
age or three-state current (per data line). The hold time will be
tDECAY plus the various output disable times as specified in the
Timing Specifications on Page 27 (for example tDSDAT for an
SDRAM write cycle as shown in SDRAM Interface Timing on
Page 30).
Capacitive Loading
Output delays and holds are based on standard capacitive loads:
30 pF on all pins/balls (see Figure 47). VLOAD is 1.5 V for VDDEXT
(nominal) = 2.5 V/3.3 V. Figure 48 on Page 52 through
Figure 55 on Page 53 show how output rise time varies with
capacitance. The delay and hold specifications given should be
derated by a factor derived from these figures. The graphs in
these figures may not be linear outside the ranges shown.
VLOAD
50:
70:
50:
4pF
2pF
400:
TESTER PIN ELECTRONICS
T1
DUT
OUTPUT
45:
0.5pF
ZO = 50:(impedance)
TD = 4.04 r 1.18 ns
Preliminary Technical Data
TBD
Figure 48. Typical Rise and Fall Times (10%–90%) versus Load Capacitance
for Driver A at EVDDMIN
TBD
NOTES:
THE WORST CASE TRANSMISSION LINE DELAY IS SHOWN AND CAN BE USED
FOR THE OUTPUT TIMING ANALYSIS TO REFELECT THE TRANSMISSION LINE
EFFECT AND MUST BE CONSIDERED. THE TRANSMISSION LINE (TD), IS FOR
LOAD ONLY AND DOES NOT AFFECT THE DATA SHEET TIMING SPECIFICATIONS.
ANALOG DEVICES RECOMMENDS USING THE IBIS MODEL TIMING FOR A GIVEN
SYSTEM REQUIREMENT. IF NECESSARY, A SYSTEM MAY INCORPORATE
EXTERNAL DRIVERS TO COMPENSATE FOR ANY TIMING DIFFERENCES.
Figure 47. Equivalent Device Loading for AC Measurements
(Includes All Fixtures)
Figure 49. Typical Rise and Fall Times (10%–90%) versus Load Capacitance
for Driver A at EVDDMAX
TBD
Figure 50. Typical Rise and Fall Times (10%–90%) versus Load Capacitance
for Driver B at EVDDMIN
Rev. PrE | Page 52 of 62 | March 2009