Electrical characteristics
STM32WB55xx STM32WB35xx
6.3.7
Embedded voltage reference
The parameters given in Table 36 are derived from tests performed under the ambient
temperature and supply voltage conditions summarized in Table 24: General operating
conditions.
Symbol
Table 36. Embedded internal voltage reference
Parameter
Conditions
Min Typ Max Unit
VREFINT
Internal reference voltage
–40 °C < TA < +125 °C 1.182 1.212 1.232
V
tS_vrefint (1)
ADC sampling time when reading
the internal reference voltage
-
tstart_vrefint
Start time of reference voltage
buffer when ADC is enabled
-
4(2)
-
-
µs
-
8
12(2)
IDD(VREFINTBUF)
VREFINT buffer consumption from
VDD when converted by ADC
-
-
∆VREFINT
Internal reference voltage spread
over the temperature range
VDD = 3 V
-
TCoeff
Temperature coefficient
–40 °C < TA < +125 °C
-
ACoeff
Long term stability
1000 hours, T = 25 °C
-
VDDCoeff
Voltage coefficient
3.0 V < VDD < 3.6 V
-
VREFINT_DIV1 1/4 reference voltage
24
VREFINT_DIV2 1/2 reference voltage
-
49
VREFINT_DIV3 3/4 reference voltage
74
1. The shortest sampling time can be determined in the application by multiple iterations.
2. Guaranteed by design.
12.5 20(2)
µA
5
7.5(2)
mV
30
50(2) ppm/°C
300 1000(2) ppm
250 1200(2) ppm/V
25
26
50
51
%
VREFINT
75
76
Figure 21. VREFINT vs. temperature
V
1.235
1.23
1.225
1.22
1.215
1.21
1.205
1.2
1.195
1.19
1.185
-40
-20
0
20
40
60
80
100
120 °C
Mean
Min
Max
MSv40169V1
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DS11929 Rev 10